Field Emission Gun-Scanning Electron Microscopes (FEG-SEM)

    Kindly download Material Safety Data sheet and submit the hardcopy of filled sheet along with your sample

  Instrument Details  

Model : JSM-7600F
SEI Resolution : 1.0nm at 15 kv
  1.5nm at 1 kv, in GB mode
Magnification : Low: 25X to 10,000X
  High: 100X to 1,000,000X at 4x5 photo size
Accerating Voltage : 0.1 to 30 kv
Probe Current Range : 1 pA to ≥ 200 nA

   The JEOL JSM-7600F FEG-SEM combines two proven technologies
– an electron column with semi-in-lens detectors and an in the lens Schottky field emission gun
– to deliver ultrahigh resolution combined with wide range of probe currents for all applications (1pA to more than 200 nA).

The JSM-7600F successfully integrates a full set of detectors that make it ideal for: anotechnology, material science, biology, compositional and micro-structural analysis.

  Contact Us   

         Contact : 022-21596863
         Email Id :

1. A requisition letter addressed to Head, SAIF along with a printout of electronic fund transfer (NEFT) proof should be sent by post or
       submitted in person to SAIF office, IIT Bombay, Powai, Mumbai-400076.

2. If you are not supposed to be present during the measurements, please mention as many details as possible, such as:
      a. Expected features you are looking for (send a representative picture if available).
      b. Images up to what magnification factor you want.
      c. Nature of your sample, for example, whether it is conducting or non-conducting.
      d. If it needs to be dispersed in any solvent (for powdered samples).
If required, please attach a separate sheet.

3. Once we receive the requisition letter and advance payment, you will receive tentative date of appointment.

4. The user will be informed about their date and time of slot by e-mail.

5. The sample should be dry and should withstand high vacuum ( ~ 10 -5 Pa). Wet biological sample can’t be done in FEG-SEM

6. The sample size should be less than 12.5 mm x 12.5 mm x 10 mm (height) and the side opposite the side of interest, should be flat (to enable sample mounting). The smaller the sample height the better.

7. The user is welcome to be present in the laboratory during analysis.

8. Before proceeding further, please review How to Use Facility and Payment Procedure for more information.

 FEG-SEM Charges without GST  
(In Rs.)
National Lab
(In Rs.)
(In Rs.)
IIT Bombay
(In Rs.)
 SEM Image (Surface OR Cross Section)   1240/-   3100/-   6200/-  620/-  Per Sample
 SEM Image (Surface + Cross Section)   1770/-   4425/-   8850/-   885/-  Per Sample
 EDS   350/-   875/-   1750/-   175/-  Per EDS analysis
 EDS Mapping   700/-   1750/-   3500/-   350/-  Per EDS map
 WDS   700/-   1750/-   3500/-   350/-  Per WDS analysis
 WDS Mapping(For 3 element maps)   1420/-   3550/-   7100/-   710/-  (For 3 element maps)
 WDS Mapping(Above 3 elements maps)   1900/-   4750/-   9500/-   950/-  (Above 3 elements maps)